Resonac Europe

MCL-HS100

Halogen Free, High Tg, Low Transmission Loss, Low CTE Multilayer Material

Product form

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CCL MCL-HS100
Prepreg GH-100

Applications

  • Semiconductor packages. (FC-CSP, PoP, SiP)
  • Thinner Module PWB

Features

  • MCL-HS100 has hybrid properties of package and high speed materials.
  • MCL-HS100 has low CTE value in X, Y directions and good dielectric property. (Dk 3.7, Df 0.0040 at 10GHz)
  • MCL-HS100(Type D) achieved low dielectric constant (3.4 at 10GHz) and low dissipation factor (0.0025 at 10GHz) using low Dk glass.
  • Well-suited for build-up construction.

Characteristics

Warpage of coreless-5 layer

TEG Chip

  • Package size: 14mm×14mm
  • Chip size: 7.3mm×7.3mm
  • Chip thickness: 150 µm
  • Underfill thickness: 60 µm (CEL-C-3730-4)

TEG Substrate

  • L1, 5: 12 µm Cu100%, L2, 3, 4: No copper, SR: –

Prepreg construction

  • GH-100 (Type D) (: 1078, R.C.: 63%)×4ply
  • GEA-700G (: 1078, R.C.: 66%)×4ply
  • GEA-705G (: 1078, R.C.: 65%)×4ply

Transmission Loss

Measurement conditions

  • Evaluation PWB: Strip-line
  • Temperature & Humidity: 25℃/60%RH
  • Characteristic impedance: Approx.50Ω
  • Proofreading method: TRL (Thru-Reflect-Line)
  • Trace width(w): 0.12–0.14mm
  • Dielectric thickness(b): 0.25mm
  • Trace thickness(t): 18 µm

Copper Clad Laminate

(t0.2, t0.4mm)

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Item Condition ※3 Unit Actual Value Reference
(IPC-TM-650)
MCL-HS100 MCL-HS100 (Type D)
Tg TMA method A 240–260 2.4.24
DMA method A 240–260
CTE ※1 X (30–120℃) A ppm/℃ 6–8
Y (30–120℃) 6–8
Z <Tg A 20–30 2.2.24
>Tg A 130–180
Solder Heat Resistance (260℃) A sec. >300
T-260 (Without Copper) A min. >60 2.4.24.1
T-288 (Without Copper) A >60
Decomposition Temperature (TGA method 5% weight loss) A 430–450 2.3.40
Copper Peel Strength 12 µm A kN/m 0.7–0.9 2.2.8
18 µm A 0.8–1.0
Surface Roughness (Ra) A µm 2–3 2.2.17
Flexural Modulus (Lengthwise) A GPa 23–28 2.4.4
Dielectric Constant 10GHz ※2 A 4.2–4.4 3.5–3.7 IEC-62810
Dissipation Factor 10GHz ※2 A 0.0050–0.0060 0.0025–0.0035
Volume Resistivity C-96/40/90 Ω・cm 1×1014–1×1016 2.5.17
Surface Resistance C-96/40/90 Ω 1×1013–1×1015
Insulation Resistance A Ω 1×1014–1×1016
D-2/100 1×1013–1×1015

※1  Heating Rate: 10℃/min.
※2  Measured by Cavity Resonator.
※3  Refer to “Condition Note”
※    Above data are experimental results and not guaranteed.

Standard Specifications

Copper Clad Laminate

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Part Number Type Copper Foil Thickness Code Name Laminate Thickness
MCL-HS100 3 µm
12 µm
(LP, HVLP)
U0.04 0.04mm
3 µm
12 µm
18 µm
35 µm
(LP, RT, HVLP)
M0.06 0.06mm
0.1 0.10mm
0.2 0.20mm
0.41 0.40mm
(D) 3 µm
12 µm
(LP, HVLP)
U0.04 0.04mm
3 µm
12 µm
18 µm
35 µm
(LP, RT, HVLP)
M0.06 0.06mm
0.1 0.10mm
0.2 0.20mm
0.41 0.40mm

※1  LP: Low profile copper foil, PF: Profile free copper foil.
※2  LP: 3 µm, 12 µm; RT: 18 µm, 35 µm; HVLP: 12 µm, 18 µm, 35 µm.
※3  The thickness means that of dielectric layer.

Prepreg

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Part Number Type Glass Cloth Properties
Style Resin Content
(%)
Dielectric Thickness
after Lamination ※1 (mm)
GH-100 (D) 0.025 (See GH-200 (Type D) page for ultra thin, flat prepregs)
0.03 (1027N71) 1027 71±2 0.042
0.05 (1037N71) 1037 71±2 0.050
0.06 (1078N61) 1078 61±2 0.071
0.1 (2116N55) 2116 55±2 0.130
(D) 0.03 (D1027N73) 1027 73±2 0.042
0.05 (D1037N74) 1037 74±2 0.051
0.06 (D1078N63) 1078 63±2 0.072
0.1 (D2116N57) 2116 57±2 0.130
Reference (IPC-TM-650) 2.3.16

※1  The dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is 0%. This value changes depending on the press condition or inner layer pattern.

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